The Ninth Lecture of “The Faculty of Innovation Engineering of M.U.S.T. - Interdisciplinary Science and Engineering Lecture Series - Electron Microscopy Imaging of Electron Bean-sensitive Crystalline Materials” Successfully Held

On the occasion of the 24th Anniversary of the Macau University of Science and Technology, Faculty of Innovation Engineering held a series of Interdisciplinary Science and Engineering Lectures, and invited experts from different fields to give a series of special lectures and share their research results and professional knowledge in the field of cutting-edge science and technology with teachers and students of our university. There are altogether 9 lectures in the Interdisciplinary Science and Engineering Lecture Series, with the ninth lecture held at the 2:30 pm on May 22, 2024 at MUST LIU’s Innovation and Technology Center.

This lecture was hosted by the Assistant Dean of the Faculty of Innovation Engineering, Professor Tang Jianxin and attended by Professor Li Liang of the Department of Materials Science and Engineering, Assistant Professor Cheong Weng Chon of the Department of Materials Science and Engineering, Assistant Professor Cai Yi Yu of Department of Materials Science and Engineering, Assistant Professor Lei Qiong of Department of Materials Science and Engineering, Assistant Professor Yin Jun of Department of Applied Physics of The Hong Kong Polytechnic University, attracted 27 bachelor and master students from the Faculty of Innovation Engineering participated.

Prof. Tang Jianxin was hosting the lecture

Professor Yu Han, Director of the Electron Microscopy Center, South China University of Technology, was invited to deliver a keynote speech on the theme of " Electron microscopy imaging of electron bean-sensitive crystalline materials", presenting their recent works pertaining to the high-resolution imaging of electron beam-sensitive materials using ultralow electron doses. Discussions of technological advances included the following: 1) The development of a suite of methods to address the challenges peculiar to low-dose TEM imaging, including rapid search for crystal zone axes, precise alignment of the image stack, and accurate determination of the defocus value, enabling efficient imaging of electron beam-sensitive crystalline materials in the high-resolution TEM (HRTEM) mode. 2) Integrated differential phase contrast STEM (iDPC-STEM) has proven to be an effective method for acquiring directly interpretable atomic-resolution images under low-dose conditions. 3) Cryogenic focused ion beam (cryo-FIB) has demonstrated a unique power to prepare (S)TEM specimens for highly sensitive materials.4) He shared his views on the great potential of four-dimensional STEM (4D-STEM) in imaging highly electron beam-sensitive materials and provide preliminary results to demonstrate its feasibility.

Prof. Yu Han was giving a speech

    After the seminar, a number of questions were raised by attending teachers and students followed by some good discussions. Prof. Yu Han shared his research achievements in the field of cutting-edge science and technology, which enriched the knowledge and skills of attendants in interdisciplinary science and engineering. Everyone was impressed with what they had gained from the seminar.

Prof. Yu Han was delivering speech to teachers and students